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Semiconductor Memories: Technology, Testing, and Reliability by Ashok K. Sharma

Semiconductor Memories: Technology, Testing, and Reliability Ashok K. Sharma ebook
ISBN: 0780310004, 9780780310001
Format: pdf
Page: 473
Publisher: Wiley-IEEE Press

Current and cutting-edge semiconductor technologies. The challenge is to not only pass the reliability tests for the technology being displaced but to demonstrate reliability based upon the end application and sensitivities of the new technology. €�These conferences, as well as others, are breeding grounds for technology development.” IEEE Recognition. The B1500A The HV-SPGU's industry-leading pulse level accuracy ensures reliable MLC memory evaluation. Renesas Electronics Corporation, a premier supplier of advanced semiconductor solutions, has developed the industry's first 40-nanometer (nm) memory intellectual property (IP) for automotive real-time applications. (NYSE: A) today announced new hardware and software capabilities for its B1500A Semiconductor Device Analyzer and EasyEXPERT software test shell, which reduce the time required for the testing and characterization of advanced non-volatile memory (NVM) cells and other next-generation semiconductor devices. Renesas develops industry's first 40nm embedded flash memory technology for automotive real-time applications; in automotive microcontrollers by autumn 2012. The 4082A's and 4082F's revolu- tionary test capabilities provide benefits for both current and advanced production parametric test. This improves the throughput of both tion of state-of-the-art flash memory cell technologies. Semiconductor Memories: Technology, Testing, and Reliability. 258- 266, May-June 2005 doi: 10.1109/MDT.2005.69; Baumann, R.C.; , “Soft errors in advanced semiconductor devices-part I: the three radiation sources,” Device and Materials Reliability, IEEE Transactions on , vol.1, no.1, pp.17-22, Mar 2001 doi: 10.1109/7298.946456 ACM. Jin-Fu Li; Yu-Jane Huang; , “An error detection and correction scheme for RAMs with partial-write function,” Memory Technology, Design, and Testing, 2005. Even though SiTime performed a high temperature operating life (HTOL) test, common for semiconductors that use both temperature and voltage stresses, to perform accelerating life testing to predict the life of a device. * Application-specific memories and architectures. Memory Technology – Off to the Races! Technical Details for Semiconductor Memories: Technology, Testing, and Reliability Memory cell structures and fabrication technologies. The 4082A combines digital archi- tecture improvements and an ultra-fast CPU with synchronous and asynchronous parallel test capabilities.